Stephen Se, Research Manager at FLIR Systems, presents the “Deep Learning for Manufacturing Inspection Applications” tutorial at the May 2019 Embedded Vision Summit.
Recently, deep learning has revolutionized artificial intelligence and has been shown to provide the best solutions to many problems in computer vision, image classification, speech recognition and natural language processing. Se presents his company’s deep learning activities for machine vision applications such as manufacturing inspection, defect detection and classification.
Deep learning has gained significant attention in the machine vision industry because it does not require the complex algorithm development used by traditional rule-based image processing techniques. Se cover the deep learning workflow from data collection to training and deployment, as well as the process of transfer learning. He presents two case studies where his company applies transfer learning to manufacturing inspection applications.
